International Journal-2016

  1. J. H. Kim, T. H. Kim, H. J. Lee, Y. R. Park, W. Choi, C. J. Lee,“Thickness-dependent electron mobility of single and few-layer MoS2 thin-film transistors“, AIP Advances 6, 065106 (2016), 2016-06-1
  2. H. J. Lee, J. H. Kim, C. J. Lee, “Electrical characteristics of MoSe2 TFTs dependent on Al2O3 capping layer” Appl Phys Lett 109, 222105 (2016) 2016-11-28